Journal Guide

Spectrochimica Acta Part B: Atomic Spectroscopy, is intended for the rapid publication of both original work and reviews in the following fields:Atomic Emission (AES), Atomic Absorption (AAS) and Atomic Fluorescence (AFS) spectroscopy;Mass Spectrometry (MS) for inorganic analysis covering Spark Source (SS-MS), Inductively Coupled Plasma (ICP-MS), Glow Discharge (GD-MS), and Secondary Ion Mass Spectrometry (SIMS).Laser induced atomic spectroscopy for inorganic analysis, including non-linear optical laser spectroscopy, covering Laser Enhanced Ionization (LEI), Laser Induced Fluorescence (LIF), Resonance Ionization Spectroscopy (RIS) and Resonance Ionization Mass Spectrometry (RIMS); Laser Induced Breakdown Spectroscopy (LIBS); Cavity Ringdown Spectroscopy (CRDS), Laser Ablation Inductively Coupled Plasma Atomic Emission Spectroscopy (LA-ICP-AES) and Laser Ablation Inductively Coupled Plasma Mass Spectrometry (LA-ICP-MS).X-ray spectrometry, X-ray Optics and Microanalysis, including X-ray fluorescence spectrometry (XRF) and related techniques, in particular Total-reflection X-ray Fluorescence Spectrometry (TXRF), and Synchrotron Radiation-excited Total reflection XRF (SR-TXRF).Manuscripts dealing with (i) fundamentals, (ii) methodology development, (iii)instrumentation, and (iv) applications, can be submitted for publication.The emphasis is on papers having a relationship with "spectrochemical analysis". The main subjects will include theoretical or experimental studies of the physical and chemical processes connected with the generation of atomic or mass spectra; the determination of atomic data; diagnostics for spectrochemical sources; the fundamentals, design or performance of complete instrumental systems, components of instruments, or devices used in any of the above stated fields of spectrometry; qualitative and quantitative analysis in the sense of complete analytical procedures using a single method or a combination of methods, or parts of complete procedures: sampling, sample preparation, sample introduction, detection, data acquisition and handling (including calibration and statistical evaluation); analytical performance and analytical figures of merit: limits of detection and limits of determination, selectivity, precision, accuracy, interferences.Authoritative and comprehensive review articles, dedicated to a particularly important topic or field of analysis, are published regularly. In addition, shorter, concise reviews or viewpoints focusing on the current status and future prospects of a field or topic particularly relevant to the development of a new analytical methodology or to a better understanding of its fundamental underlying principles are welcome. Tutorial reviews, illustrating in depth fundamental concepts in atomic spectroscopy and analytical atomic spectroscopy, are also published.Articles describing an application of a spectroscopic technique to analysis will also be considered. In this case, however, the spectroscopic flavor of the manuscript should be substantial: mere analytical recipes or papers emphasizing separation and pre-concentration techniques should not be submitted. Finally, to the editors' discretion, accelerated publication of short papers dealing with new important concepts, instrumental developments or applications will be considered.

An international forum for academics, industrialists and engineers to publish the latest research in surface topography measurement and characterisation, instrumentation development and the properties of surfaces.

EPJ AP an international journal devoted to the promotion of the recent progresses in all fields of applied physics.The articles published in EPJ AP span the whole spectrum of applied physics research.Sections covered:* Semiconductors and devices*Physics of organic materials and devices*Thin films*Nanomaterials and nanotechnologies*Photonics*Spintronics, magnetism and superconductivity*Imaging, microscopy and spectroscopy*Plasma, discharges and processes*Physics of energy transfer, conversion and storage*Instrumentation and metrology*Physics and mechanics of fluids, microfluidics*Biophysics and biosensors*Surfaces and interfaces.

Thermochimica Acta publishes original research contributions covering all aspects of thermoanalytical and calorimetric methods and their application to experimental chemistry, physics, biology and engineering. The journal aims to span the whole range from fundamental research to practical application.The journal particularly welcomes papers from newly emerging areas as well as from the traditional strength areas:- New and improved instrumentation and methods- Thermal properties and behavior of materials- Kinetics of thermally stimulated processesEach paper submitted for publication should clearly present:a) Scientific motivation (i.e., why this study is of interest);b) Relevance to the stated scope of Thermochimica Acta (i.e., why thermal methods play a crucial role in the study, or why this study is important for the use and development of thermal methods);c) General significance of the obtained results (i.e., how this study contributes to the advancement of knowledge in the general area of the study). Note that novelty of a study does not necessarily imply general significance of the results.Manuscripts reporting kinetic calculations are expected to follow the ICTAC Kinetics Committee recommendations, Thermochim. Acta 520 (2011) 1-19The journal publishes regular full-length articles, short communications (either novel, unexpected theoretical or experimental results or short reports of collections of new data), and reviews (usually invited by an Editor, but proposals from authors are welcome).

Transactions of the Institute of Measurement and Control covers applications in instrumentation and control. Transactions of the Institute of Measurement & Control covers: systems and control theory, sensors and signal processing, man/machine interface, computing for measurement, control and automation, adaptive control, advanced robotics, dynamic simulation and switched systems.

Ultramicroscopy is an established journal that provides a forum for the publication of original research papers, invited reviews and rapid communications. The scope of Ultramicroscopy is to describe advances in instrumentation, methods and theory related to all modes of microscopical imaging, diffraction and spectroscopy in the life and physical sciences.Benefits to authorsWe also provide many author benefits, such as free PDFs, a liberal copyright policy, special discounts on Elsevier publications and much more. Please click here for more information on our author services.Please see our Guide for Authors for information on article submission. If you require any further information or help, please visit our support pages: http://support.elsevier.com

Vacuum is an international rapid publications journal with a focus on short communication. All papers are peer-reviewed, with the review process for short communication geared towards very fast turnaround times. The journal also published full research papers, thematic issues and selected papers from leading conferences.A report in Vacuum should represent a major advance in an area that involves a controlled environment at pressures of one atmosphere or below.The scope of the journal includes:1. Vacuum; original developments in vacuum pumping and instrumentation, vacuum measurement, vacuum gas dynamics, gas-surface interactions, surface treatment for UHV applications and low outgassing, vacuum melting and sintering. Technology and solutions for large-scale facilities (e.g., particle accelerators and fusion devices). New instrumentation ( e.g., detectors and electron microscopes). 2. Plasma science; advances in PVD, CVD, plasma-assisted CVD, ion sources, deposition processes and analysis.3. Surface science; surface engineering, surface chemistry, surface analysis, crystal growth, ion-surface interactions and etching, nanometer-scale processing, surface modification.4. Materials science; novel functional or structural materials. Metals, ceramics, and polymers. Experiments, simulations, and modelling for understanding structure-property relationships. Thin films and coatings. Nanostructures and ion implantation.Benefits to authorsWe also provide many author benefits, such as free PDFs, a liberal copyright policy, special discounts on Elsevier publications and much more. Please click here for more information on our author services.Please see our Guide for Authors for information on article submission. If you require any further information or help, please visit our support pages: http://support.elsevier.com